XJL-301 reflected metallurgical microscope can be used for brightfield, darkfield, simple polarzing observations. It is the ideal instruments for inspecting semiconductors, packages, electronics substrates, materials.

Features
1. With long working distance plan achromatic objectives (no cover glass) and wide-field eyepieces, can get clear pictures and wide view field.
2. With large move range mechanical stages, moving range: 8"x 8"(204mm x 204mm).
3. Coaxial coarse/fine focus system, with tensional adjustable and up stop, minimum division of fine focusing: 0.8μ M.
4.6V 30W halogen lamp, adjustable brightness.
5. Trinocular, can switch to normally/polarize observation, brightfield/darkfield observation. Can send 100% of light to the binocular eyepieces or to the top port.